January
2006, Issue 186
Electronic
Scarecrow
SENSORS
Each
sensor (except the on-board accelerometer) has its own
board and is connected directly to the SARD board. The
MMA6261Q XY-axis accelerometers are the most straightforward.
Their outputs are RC filtered to eliminate the noise
from their internal switched capacitor filters. The
outputs are then fed directly to the microcontroller’s
ADC. Power comes from the switched 3-V supply.
The
MMA1260D Z-axis accelerometer is a bit more complicated.
The accelerometer’s I/O levels have to be shifted because
5 V powers it. An on-board regulator supplies 5 V from
the switched 9-V supply.
The
MPXM2010GS pressure sensor shares the same input as
the MMA1260D Z-axis accelerometer, so only one of them
can be connected at a time. They have different output
levels in Self Test mode, allowing the software to automatically
distinguish between them. The sensor, which operates
directly from the 9-V switched power, produces an output
signal of only 25 mV. This signal is amplified with
a TLC271B op-amp. It’s then shifted up from ground by
approximately 500 mV to compensate for the worst-case
op-amp and sensor offsets.
The
MC33794 e-field sensor IC measures small changes in
capacitance from up to nine electrodes. A built-in shield
driver minimizes the effect of electrode cable capacitance.
It’s powered from the switched 9-V supply.
The
MC33993 switch expander is configured to handle pairs
of IR LEDs and phototransistors. The expander wakes
up every 64 ms for 125 µs to check the sensors, and
it interrupts the microcontroller if the status changes.
It also has to be able to wake up the radio to enable
its CLKO pin, which supplies the MC9S08GT16 microcontroller’s
clock. I do this by feeding the expander’s *WAKE output
to the radio’s *ATTN input. The MC9S08GT16 microcontroller
can disable this function by holding port pin PTC2 high.
The LED outputs are set to source 16 mA of drive current
on SP7:0. The sense inputs SG7:0 are set to 2 mA. Pins
SG13:8 are hard-wired to an alternating high/low pattern
for the purposes of self-testing.